Infineon Technologies AG
|Working Student + Master's Thesis – Design-for-Test
Munich, Bavaria, Germany
Summary
Led the development and verification of advanced Design-for-Test solutions for automotive microcontrollers as part of Master's thesis.
Highlights
Developed a Verilog-based DFT solution with Tcl automation, significantly improving BIST insertion efficiency and pattern generation for automotive microcontrollers.
Designed and verified synthesizable RTL for a critical TCAM module, ensuring functionality and performance for next-generation automotive microcontrollers.
Created comprehensive memory library files and custom operations, enhancing overall test coverage for complex memory architectures.
Performed detailed fault analysis with standard and custom algorithms, accurately identifying and localizing design defects within critical components.
Implemented IJTAG-based column/row repair and comprehensive diagnostic analysis, improving silicon yield and debug efficiency for advanced semiconductor products.